Electron microscopes
Systems for In-situ experiments
MODEL 2020 Advanced Tomography Holder
Obtaining 3D Structural Information in Transmission Electron Microscopy.
Main pecifications:
Carrier grid diameter:3 mm
Sample thickness: 250μm
Drift: 1.5 nm/min
Tilt angle: Up to ±80°
Field of view: Up to 1.6 mm at 70°
